Referinte

Sursele folosite in referat si in implementare.

NIST CSRC - software + documentatiearcetri/sts pe GitHub
  1. [1]L. E. Bassham et al., A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications, NIST SP 800-22 Rev 1a, 2010. https://doi.org/10.6028/NIST.SP.800-22r1a
  2. [2]L. C. Noll, T. Gilgan, R. Paccagnella, sts - NIST Statistical Test Suite (versiune refactorizata, GitHub). https://github.com/arcetri/sts
  3. [3]S.-J. Kim, K. Umeno, A. Hasegawa, Corrections of the NIST Statistical Test Suite for Randomness, 2004. https://arxiv.org/abs/nlin/0401040
  4. [4]K. Hamano, The Distribution of the Spectrum for the DFT Test Included in SP800-22, IEICE Trans. Fundamentals E88-A(1):67-73, 2005. https://doi.org/10.1093/ietfec/e88-a.1.67
  5. [5]F. Pareschi, R. Rovatti, G. Setti, On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite..., IEEE TIFS 7(2):491-505, 2012. https://doi.org/10.1109/TIFS.2012.2185227
  6. [6]A. Iwasaki, Deriving the Variance of the DFT Test Using Parseval's Theorem, 2018. https://arxiv.org/abs/1806.10357
  7. [7]A. Iwasaki, K. Umeno, A new randomness test solving problems of the DFT Test, 2017. https://arxiv.org/abs/1708.08218
  8. [8]S. Zhu, Y. Ma, J. Lin, J. Zhuang, J. Jing, More Powerful and Reliable Second-Level Statistical Randomness Tests for NIST SP 800-22, ASIACRYPT 2016. https://eprint.iacr.org/2016/863
  9. [9]D. Chen, H. Chen, L. Fan, K. Luo, Error Analysis of NIST SP 800-22 Test Suite, IEEE TIFS vol. 18, 2023. https://doi.org/10.1109/TIFS.2023.3287391
  10. [10]L. I. Bluestein, A linear filtering approach to the computation of the DFT, IEEE Trans. Audio Electroacoust. 18(4):451-455, 1970. https://doi.org/10.1109/TAU.1970.1162132